Field Emission Scanning Electron Microscope (FE-SEM)

• GeminiSEM 300 lets you experience high resolution and high contrast even on extremely large fields of view. Especially, but not solely, liked by novice users at high or low vacuum.

• Image large fields of view with excellent image quality and fast-time-to-image.

• Count on efficient detection, excellent resolution and distortion-free, large-area images.

• Profit from the novel optical design’s high gun resolution mode that is tailored to low voltage imaging even for challenging samples, such as beam-sensitive or magnetic materials.

• Characterize your sample comprehensively: obtain unique low voltage, material contrast with the energy selective backscatter detector.

• Utilize the NanoVP mode: Image non-conductive specimens at high resolution with excellent surface sensitivity with the Inlens SE detector at higher pressures.

  Technical Specifications ZEISS GeminiSEM 300

• Resolution: 0.6 nm @ 30 kV (STEM) ,0.7 nm @ 15 kv ,1.2 nm @ 1 kv, 1.1 nm @ 1kV TD
• Inlens BSE Resolution: 1.2 nm @ 1 kV
• Resolution in Variable Pressure mode (30 Pa) : 1.4 nm @ 3 kV and 1.0 nm @ 15 kv
• Acceleration Voltage: 0.02 - 30 kV
• Probe Current: 3 pA - 20 nA (100 nA configuration also available)
• Magnification: 12 – 2,000,000
• Electron Emitter: Thermal field emission type, stability better than 0.2 %/h
• Detectors available in basic configuration:
  Inlens Secondary Electron detector
  Everhart Thornley Secondary Electron detector
• Store Resolution:Up to 32k × 24k pixels
• Specimen Stage:
  5-axes motorized eucentric specimen stage
  X = 130 mm; Y = 130 mm
  Z = 50 mm
  T = -4º to 70º , R = 360º

EDAX

Model:Octane Plus

Active Area: 30 mm²

Microscope/Port: Gemini 300/EDS