Atomic Force Microscope
Multimode 8 high perfomance AFM with high speed ScanAsyst mode. Bruker’s exclusive ScanAsyst ® mode offers automatic image optimization for faster, more consistent results. It will continuously adjust scan rate, setpoint and gains to obtain the highest quality image. State of the art NanoScope ® V controller electronics offer exceptionally low noise along with unmatched bandwidth and processing power for the most demanding applications.Bruker’s exclusive Peak Force Tapping technology
enables exceedingly low tip-sample interaction forces— even lower than is possible with TappingModeTM.
ScanAsyst dramatically simplifies obtaining high-quality images. It accomplishes this with algorithms that can automatically optimize imaging parameters, including setpoint, gains and scan rate. This feature makes operation faster and more convenient for both AFM novices and seasoned AFM researchers. ScanAsyst also yields higher performance. Unlike TappingMode and other AC modes, ScanAsyst is based on Bruker’s exclusive Peak Force Tapping technology, which allows direct control of the tip-sample interaction force at ultra-low levels. This helps protect delicate samples and preserve the sharpest possible tip.
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General Imaging Modes |
ScanAsyst Mode and Tapping Mode |
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Scanner |
AS-130VLR scanner – 125μm x 125μm XY and 5μm Z range (vertical engage), features improved liquid resistance and 4-year warranty against liquid damage |
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Standard Accessories |
Included with all MultiMode 8 system configurations: OMV, Optical microscope with 10X objective for viewing tip, sample, and laser, (video output – Force Modulation and Conductive AFM (C-AFM) |
| Imaging Noise Level | <0.3Å RMS (Z noise using TappingMode in air at zero scan size) |
| Maximum Sample Size | 15mm diameter x 5mm thick |
| Laser Classification | Class 2M, 1mW maximum at 690nm (IEC and US CDRH) |
