The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It leads SPECTRO’s newest generation of ED-XRF instruments, providing breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy.The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
The SPECTRO XRF Analyzer Pro operating software interface used in SPECTRO XEPOS has been redesigned and optimized — with third-party testing and benchmarking, plus extensive user input — to be exceptionally easy to learn and use.
TECHNICAL SPECIFICATIONS
Excitation
• X-ray tube with thick binary Pd/Co alloy anode with air-cooling
• Max. power: 50 W
• Max. voltage: 50 kV
• Adaptive excitation system with optimized filters
• HAPG polarizer for improved sensitivity of elements in the range Na-Cl
• Bandpass filter for improved performance for elements in the range K-Mn
Detection
• SDD with Peltier cooling
• Large detector area (30 mm 2 ,active area 20 mm 2 )
• Spectral resolution (FWHM) ≤ 130 eV for Mn K-alpha
• Input count rate up to 1,000,000 counts per second
• Detector filter changer for active pile-up reduction
